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Overview of current technologies for through-the-wall-surveillanceGAUGUE, Alain C; POLITANO, Jean-Luc.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 59891H.1-59891H.11, issn 0277-786X, isbn 0-8194-6011-7, 1VolConference Paper

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Scanning tunneling microscopy investigation of nonanuclear [3 × 3] Mn^II supramolecular gridsSHAPTER, J. G; WEEKS, L; THOMPSON, L. K et al.Smart materials and structures. 2006, Vol 15, Num 1, pp S171-S177, issn 0964-1726Article

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Dark-field contrast of elements in high-voltage electron microscopyBHATTACHARYA, D. K; BHAKAT, P.Japanese journal of applied physics. 1997, Vol 36, Num 5A, pp 2918-2921, issn 0021-4922, 1Article

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